Waters has now unveiled the new Xevo TQ-XS mass spectrometer, which is far advanced  sensitive bench-top tandem quadrupole instrument. It features a unique combination of ion optics, detection and ionization technologies resulting in levels of sensitivity not previously seen. The Xevo TQ-XS is expected to be available for shipment in June 2016 and was on public display for the first time at MSSJ in Osaka, Japan, May 18 – 20. It will be on display at ASMS in San Antonio, TX, June 5 – 9.

"UPLC-MS quantitative studies are more important than ever and factor into just about every decision made by scientists. Today’s customers need to carry out reproducible quantitative studies and reach lower limits of quantification with an instrument that is accessible to all users. With this new mass spectrometer, our product designers pioneered some ingenious electronic and mechanical advances,” said Gary Harland, senior director MS Product Management.

“With a thorough understanding of the instrument physics, they’ve engineered an analytical tool that leads to new levels of reliability, reproducibility, and performance never before seen in quantitative mass spectrometry analysis,” he added.

The company said that the new levels of performance have been achieved through a number of technological advances. The StepWave XS ion guide removes neutral species and transmits ions in a more focused beam to the detector by incorporating segmented quadrupole transfer optics in the second stage. Customer experience has been improved through the introduction of the new tool-free atmospheric pressure ionization probes. These allow scientists to perform routine maintenance in less than two minutes meaning greater operator-to-operator reproducibility and more time analysing samples.

The Xevo TQ-XS system joins a portfolio of Xevo mass spectrometers including; the Xevo TQD, the Xevo TQ-S micro and the Xevo G2-XS QTof. Xevo mass spectrometers are characterized by their universal ion source architecture: interchangeable ion sources that can be fitted to, or removed from, the face of the mass spectrometer in minutes, without the need to vent the system. This has changed the way analytical chemists with little previous mass spectrometry experience working in high-throughput labs can use the instrumentation at maximum performance.